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	<title>MeasurementBlog &#187; Measurement QA</title>
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	<description>Measurement devices, measurement education &#38; measuring</description>
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		<title>Commissioning a New Sensor</title>
		<link>http://www.measurementblog.com/resource/commissioning-a-new-sensor/</link>
		<comments>http://www.measurementblog.com/resource/commissioning-a-new-sensor/#comments</comments>
		<pubDate>Wed, 27 Jan 2010 21:00:29 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement Basics]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Resource]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=151</guid>
		<description><![CDATA[<br/>Original Article dated: Dec 17, 2008 By: G. Raymond Peacock, Temperatures.com Inc. During the past year, I&#8217;ve been discussing some of the best practices required to successfully add a new sensor to your operations. This month, I&#8217;ll examine the next to the last step in the process: commissioning the sensor. In this phase, you&#8217;re simply [...]]]></description>
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		<slash:comments>2</slash:comments>
		</item>
		<item>
		<title>Get an Expert with Your Sensor</title>
		<link>http://www.measurementblog.com/measurement-qa/get-an-expert-with-your-sensor/</link>
		<comments>http://www.measurementblog.com/measurement-qa/get-an-expert-with-your-sensor/#comments</comments>
		<pubDate>Fri, 15 May 2009 14:28:52 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement Basics]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Temperature]]></category>
		<category><![CDATA[buyer]]></category>
		<category><![CDATA[questex]]></category>
		<category><![CDATA[sensor]]></category>
		<category><![CDATA[sensor expert]]></category>
		<category><![CDATA[sensorsmag.com]]></category>
		<category><![CDATA[steel temperature]]></category>
		<category><![CDATA[vendor]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=169</guid>
		<description><![CDATA[<br/>This eighth essay in a series on Sensorsmag.com. It is reproduced here with permission of SensorsMag a Questex Media Group, Inc. publication. The format has been slightly changed to make it easier to read online. Jul 22, 2008 &#8211; by: G. Raymond Peacock, Temperatures.com Inc. &#8211; Sensors This is the eighth essay in a series [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/measurement-qa/get-an-expert-with-your-sensor/feed/</wfw:commentRss>
		<slash:comments>1</slash:comments>
		</item>
		<item>
		<title>Reviewing Error Analysis</title>
		<link>http://www.measurementblog.com/resource/reviewing-error-analysis/</link>
		<comments>http://www.measurementblog.com/resource/reviewing-error-analysis/#comments</comments>
		<pubDate>Tue, 03 Mar 2009 09:23:20 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Education]]></category>
		<category><![CDATA[Measurement Basics]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Resource]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=155</guid>
		<description><![CDATA[<br/>This is the fifth essay in a series expanding on an article I wrote for Sensors (Sensorsmag.com) titled &#8220;A Twelve-Step Sensor Selection Checklist.&#8221; . (Note: It has been modified very slightly to make it more easily read in this format) This month, I&#8217;ll look at the phase of the sensor selection process in which you [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/resource/reviewing-error-analysis/feed/</wfw:commentRss>
		<slash:comments>1</slash:comments>
		</item>
		<item>
		<title>The Deming Model</title>
		<link>http://www.measurementblog.com/measurement-qa/the-deming-model/</link>
		<comments>http://www.measurementblog.com/measurement-qa/the-deming-model/#comments</comments>
		<pubDate>Sat, 28 Feb 2009 07:24:06 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Deming]]></category>
		<category><![CDATA[Education]]></category>
		<category><![CDATA[Measurement QA]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=125</guid>
		<description><![CDATA[<br/>The teachings and experiences of W. Edwards Deming slowly took hold in my learning as I worked for a USA Steel Company in Ohio in the 1980s and &#8217;90s. I knew little about Quality Assurance when I first joined the orgainzation, but got involved in their system of Statistical Process Control, that had been dubbed [...]]]></description>
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		<slash:comments>1</slash:comments>
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		<title>Factors Influencing Measurement and Calibration Uncertainty</title>
		<link>http://www.measurementblog.com/measurement-qa/factors-influencing-measurement-and-calibration-uncertainty/</link>
		<comments>http://www.measurementblog.com/measurement-qa/factors-influencing-measurement-and-calibration-uncertainty/#comments</comments>
		<pubDate>Mon, 16 Feb 2009 18:23:39 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement Basics]]></category>
		<category><![CDATA[Measurement QA]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=161</guid>
		<description><![CDATA[<br/>By: G. Raymond Peacock, Temperatures.com Inc. &#8211; As published in Sensors This is the third essay in a series expanding on an article I wrote for SensorsMag.com (Oct 23, 2007 ) titled &#8220;A Twelve-Step Sensor Selection Checklist&#8220;. This month&#8217;s piece deals with the factors that influence measurement and calibration uncertainty. (Note: It has been modified [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/measurement-qa/factors-influencing-measurement-and-calibration-uncertainty/feed/</wfw:commentRss>
		<slash:comments>0</slash:comments>
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		<title>Research – Measurement –  Testing</title>
		<link>http://www.measurementblog.com/website/research-%e2%80%93-measurement-%e2%80%93-testing/</link>
		<comments>http://www.measurementblog.com/website/research-%e2%80%93-measurement-%e2%80%93-testing/#comments</comments>
		<pubDate>Sun, 20 Jul 2008 04:12:15 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Education]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Organizations]]></category>
		<category><![CDATA[Website]]></category>
		<category><![CDATA[measurement]]></category>
		<category><![CDATA[metrology monograph]]></category>
		<category><![CDATA[ptb]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=128</guid>
		<description><![CDATA[<br/>While following a web lead the other day I found these most interesting measurement publications on sale at the PTB web site in Germany. Here&#8217;s some of the text and an image from their pages. Monograph series of the Physikalisch-Technische Bundesanstalt (PTB) Braunschweig, Germany &#8211; The monograph series serves to present subjects which ensue from, [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/website/research-%e2%80%93-measurement-%e2%80%93-testing/feed/</wfw:commentRss>
		<slash:comments>1</slash:comments>
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		<item>
		<title>Deming Vs Dilbert: Background</title>
		<link>http://www.measurementblog.com/uncategorized/deming-vs-dilbert-background/</link>
		<comments>http://www.measurementblog.com/uncategorized/deming-vs-dilbert-background/#comments</comments>
		<pubDate>Mon, 16 Jun 2008 05:07:46 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Education]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Organizations]]></category>
		<category><![CDATA[Uncategorized]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=114</guid>
		<description><![CDATA[<br/>To get back into the real sharing activity and intent of this blog to share my experiences with visitors, I plan to begin a series of short stories about my measurement experiences in both a small and large organizations over my multiple careers in R&#038; D, Instrument Marketing and web publishing. In my multifaceted careers [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/uncategorized/deming-vs-dilbert-background/feed/</wfw:commentRss>
		<slash:comments>1</slash:comments>
		</item>
		<item>
		<title>NCSL International: A CALL TO ACTION FOR METROLOGY IN THE USA</title>
		<link>http://www.measurementblog.com/resource/ncsl-international-a-call-to-action-for-metrology-in-the-usa/</link>
		<comments>http://www.measurementblog.com/resource/ncsl-international-a-call-to-action-for-metrology-in-the-usa/#comments</comments>
		<pubDate>Thu, 29 May 2008 13:29:53 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement Basics]]></category>
		<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Organizations]]></category>
		<category><![CDATA[Resource]]></category>
		<category><![CDATA[2010 SOC]]></category>
		<category><![CDATA[2010 Standard Occupational Classification (SOC) System]]></category>
		<category><![CDATA[calibration engineer]]></category>
		<category><![CDATA[calibration technician]]></category>
		<category><![CDATA[Chief Statistician]]></category>
		<category><![CDATA[critical to the U.S. economy]]></category>
		<category><![CDATA[critical to the U.S. national defense]]></category>
		<category><![CDATA[erroneously use the word 'calibrate']]></category>
		<category><![CDATA[Katherine K. Wallman]]></category>
		<category><![CDATA[Metrologist]]></category>
		<category><![CDATA[Metrology job descriptions]]></category>
		<category><![CDATA[NCSL International]]></category>
		<category><![CDATA[no existing standard occupational classifications]]></category>
		<category><![CDATA[Occupational Outlook Handbook]]></category>
		<category><![CDATA[Office of Management and Budget]]></category>
		<category><![CDATA[the Metrology Community]]></category>
		<category><![CDATA[US Dept. of Labor]]></category>

		<guid isPermaLink="false">http://measurementblog.com/?p=112</guid>
		<description><![CDATA[<br/>NCSL International issues a call to action by the Metrology Community Boulder CO, USA &#8212; According to NCSL International&#8217;s Press release dated May 28th: The US Dept. of Labor rejects petition to recognize Metrology job descriptions in its proposed 2010 Standard Occupational Classification (SOC) System&#8221; We know that Metrology is the bedrock upon which all [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/resource/ncsl-international-a-call-to-action-for-metrology-in-the-usa/feed/</wfw:commentRss>
		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>Dynamic MSA</title>
		<link>http://www.measurementblog.com/website/dynamic-msa/</link>
		<comments>http://www.measurementblog.com/website/dynamic-msa/#comments</comments>
		<pubDate>Wed, 06 Feb 2008 10:46:08 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Organizations]]></category>
		<category><![CDATA[Resource]]></category>
		<category><![CDATA[Website]]></category>
		<category><![CDATA[analysis]]></category>
		<category><![CDATA[measurement]]></category>
		<category><![CDATA[MSA]]></category>
		<category><![CDATA[QA]]></category>
		<category><![CDATA[SPC]]></category>
		<category><![CDATA[system]]></category>

		<guid isPermaLink="false">http://measurementblog.com/archives/88</guid>
		<description><![CDATA[<br/>Measurement System Analysis (MSA) as a dynamic, rather than static, beastie is discussed in a new online article entitled:Dynamic Analysis Offers a Better MSA Management Alternative on Semiconductor International, A Reed publication, by author Phillip H. Williams from Freescale Semiconductor. Among its answers to the question: &#8220;How often must we repeat our measurement system analysis?&#8221;, [...]]]></description>
		<wfw:commentRss>http://www.measurementblog.com/website/dynamic-msa/feed/</wfw:commentRss>
		<slash:comments>0</slash:comments>
		</item>
		<item>
		<title>One Day NYC Symposium on Deming&#8217;s Analytic Papers</title>
		<link>http://www.measurementblog.com/resource/one-day-nyc-symposium-on-demings-analytic-papers/</link>
		<comments>http://www.measurementblog.com/resource/one-day-nyc-symposium-on-demings-analytic-papers/#comments</comments>
		<pubDate>Wed, 19 Sep 2007 18:30:44 +0000</pubDate>
		<dc:creator>Ray</dc:creator>
				<category><![CDATA[Measurement QA]]></category>
		<category><![CDATA[Resource]]></category>

		<guid isPermaLink="false">http://measurementblog.com/archives/60</guid>
		<description><![CDATA[<br/>Although many people know Dr. W. Edwards Deming mainly for his work in management, he is better known in the statistical and legal communities for his analytic work, especially sampling theory and practice. The Deming Institute is co-sponsoring a one-day symposium that will focus only on his statistical work. Papers for the September 24, 2007 [...]]]></description>
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		<slash:comments>0</slash:comments>
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