Measurement System Analysis (MSA) as a dynamic, rather than static, beastie is discussed in a new online article entitled:Dynamic Analysis Offers a Better MSA Management Alternative on Semiconductor International, A Reed publication, by author Phillip H. Williams from Freescale Semiconductor.
Among its answers to the question: “How often must we repeat our measurement system analysis?”, is Dynamic MSA and, “..the key to performing a dynamic MSA is to have SPC properly implemented for the subject measurement system. In practice, this should be done regardless of MSA intent — to guarantee the stability of the measurement system.”
We think it is well worth a read.
Enjoy!
